abinit/tests/v5/Input/t82.abi

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ecut 5
kptopt 3
tolvrs 1.0D-10
rfelfd 3
rfdir 1 1 1
nqpt 1
qpt 3*0
irdwfk 1
irdddk 1
prtden 0
prteig 0
prtwf 0
nstep 50
acell 3*5.43 angstrom
rprim
0 1/2 1/2
1/2 0 1/2
1/2 1/2 0
occopt 1
nband 4
ngkpt 2 2 2
nshiftk 4
shiftk
3*1/2
1/2 0 0
0 1/2 0
0 0 1/2
#
znucl 14
ntypat 1
typat 2*1
natom 2
xred 3*0 3*1/4
#Backwards compatibility
asr 0 # The default value 1 is preferable, this is only to keep backward compatibility for the automatic tests
chneut 0 # The default value 1 is preferable, this is only to keep backward compatibility for the automatic tests
pp_dirpath "$ABI_PSPDIR"
pseudos "PseudosTM_pwteter/14si.pspnc"
#%%<BEGIN TEST_INFO>
#%% [setup]
#%% executable = abinit
#%% test_chain = t81.abi, t82.abi, t83.abi, t84.abi
#%% [files]
#%% files_to_test =
#%% t82.abo, tolnlines = 0, tolabs = 0.000e+00, tolrel = 0.000e+00, fld_options = -medium
#%% [paral_info]
#%% max_nprocs = 2
#%% [extra_info]
#%% authors = Unknown
#%% keywords = NC, DFPT, DDK
#%% description =
#%% Compute silicon electric field perturbation, using WFK and DDK files produced in previous test.
#%%<END TEST_INFO>