fallback asyetest

tests/asyetest/main.c

@@ -4,10 +4,6 @@
 
 int ntraps = 0;
 _RegSet* handler(_Event ev, _RegSet *regs) {
-  for(const char *p = "intr:"; *p; p++) _putc(*p);
-  _putc(_intr_read() ? '1' : '0');
-  _putc('\n');
-
   switch (ev.event) {
     case _EVENT_IRQ_TIMER:
       printf(".");
@@ -25,48 +21,21 @@ _RegSet* handler(_Event ev, _RegSet *regs) {
       }
       break;
     case _EVENT_YIELD:
-      // assert(_intr_read() == 0);
+      assert(_intr_read() == 0);
       ntraps++;
       break;
   }
   return regs;
 }
 
-#define _STR(x) _VAL(x)
-#define _VAL(x) #x
-
-#define MFC0(dst, src, sel) \
-asm volatile("nop; nop; mfc0 %0, $"_STR(src)", %1; nop; nop\n\t":"=r"(dst):"i"(sel))
-
-void read_write_cp0() {
-  int reg;
-#define CP0_OUT(src, sel) \
-  reg = 0x12345678; \
-  MFC0(reg, src, sel); \
-  printf("CP0:{" #src ", " #sel "}=%x\n", reg);
-  CP0_OUT(8, 0) // badvaddr
-  CP0_OUT(9, 0) // count0
-  CP0_OUT(9, 1) // count1
-  CP0_OUT(11, 0) // compare
-  CP0_OUT(12, 0) // status
-  CP0_OUT(13, 0) // cause
-  CP0_OUT(14, 0) // epc
-}
-
 int main(){
   _ioe_init();
   _asye_init(handler);
-  read_write_cp0();
   assert(!_intr_read());
   _intr_write(1);
   //_make(_heap, void*)main, 0);
-  printf("intr:%x\n", _intr_read());
-  _yield();
   while (1) {
-	for(int i = 0; i < 10; i++)
-	  printf("-");
-	printf(":yield, intr:%x\n", _intr_read());
-	while(1); // no yield
+    _yield();
   }
   return 0;
 }